Dimensing Technology’s SP-D OCT spectrometer modules have been designed to have exceptional imaging performance, affordable cost and easy integration. The imaging depth can reach up to 10.8 mm, allowing various applications for medical and industrial use. Uniform wave number sampling is pre-calibrated, eliminating tedious calibration and allowing diffraction limited axial point spread function across the entire measurement range. The camera sensors are based on CMOS technology, without using costly InGaAs detectors to achieve deep scans. The cameras are supported with GigE and GenICam protocols, enabling easily integration into different software development environments.
- Imaging depths up to 10.6 mm in air at 830 nm with exceptional roll-off performance.
- Pre-calibration for uniform wave number sampling with diffraction limited axial point spread functions across the entire measurement range.
- Cost-effective CMOS camera sensors with great sensitivity.
- GigE and GenICam protocols supported cameras for easy software development.
Detector
Sensor type: Line-scan CMOS
Effective pixels: Options of 2048 / 4096 pixels
Line scan speed: Options of 28 kHz / 56 kHz / 66.6 kHz /195 kHz
ADC bit depth: Options of 8 / 10 / 12 bit
Optical Specifications
Wavelength range (customizable): 800 nm – 870 nm
Spectral resolution (customizable): 0.017 nm / 0.034 nm
Imaging depth (in air): 10.8 mm / 5.4 mm
Optical design: VPH grating, linear wavenumber correction
Input light interface: FC/APC fiber optic connector
Electrical Specifications
Hardware interface: Gigabit Ethernet (1000 Mbit/s) / Fast Ethernet (100 Mbit/s) / USB3.0 / Camera Link
Data output interface: GigE Vision V2.0, GenICam
Power supply: DC 12V – 24V
Physical Specifications
Dimensions: 450 mm × 150 mm × 220 mm
Weight: 3 kg
The left figure shows the amplitude roll-off data at different imaging depths. With careful optical system design, the crosstalk between different pixels is minimized, and the roll-off is < 6 dB for 4 mm imaging depth.
The right figure shows the axial point spread function (PSF) full width half maximum (FWHM) across the imaging depth. The axial PSF keeps close to the diffraction limited value across the entire imaging depth.
The characterization of axial PSF is performed with a superluminescent diode with center wavelength λ of 835 nm and spectral width Δλ of 49 nm. The theoretical diffraction limited axial PSF is calculated as λ^2/Δλ/2, where the division of 2 corresponds to the reflection double path.